Electromagnetic-Fields In 2-Dimensional Models Of Near-Field Optical Microscope Tips

The design of tips is of outstanding importance to obtain maximal efficiency in scanning near-field microscopy. As a support towards this optimization, this work presents the computation of the electromagnetic field penetrating into two-dimensional tips. The investigated geometries consist of elongated two-dimensional dielectric slabs (glass) terminated by pointed tips. Distributions of the electric field amplitude inside and outside two-dimensional models of tips are computed and from those solutions, far-field differential cross-sections are obtained.


Published in:
Ultramicroscopy, 60, 1-9
Year:
1995
Publisher:
Elsevier
ISSN:
0304-3991
Laboratories:




 Record created 2011-04-11, last modified 2018-03-17

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