Optical microscopy in the nano-world
Bach, H.; Bopp, M. A.; Deckert, V.; Descouts, P.; Eckert, R.; Guntherodt, H. J.; Hafner, C.; Hecht, B.; Heinzelmann, H.; Huser, T.; Jobin, M.; Keller, U.; Lacoste, T.; Lambelet, P.; MarquisWeible, F.; Martin, O. J. F.; Meixner, A. J.; Nechay, B.; Novotny, L.; Pfeiffer, M.; Philipona, C.; Plakhotnik, T.; Renn, A.; Sayah, A.; Segura, J. M.; Sick, B.; Siegner, U.; Tarrach, G.; Vahldieck, R.; Wild, U. P.; Zeisel, D.; Zenobi, R.; Pohl, D. W.
1997

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Abstract

Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland.

Details

Title Optical microscopy in the nano-world
Author(s) Bach, H. ; Bopp, M. A. ; Deckert, V. ; Descouts, P. ; Eckert, R. ; Guntherodt, H. J. ; Hafner, C. ; Hecht, B. ; Heinzelmann, H. ; Huser, T. ; Jobin, M. ; Keller, U. ; Lacoste, T. ; Lambelet, P. ; MarquisWeible, F. ; Martin, O. J. F. ; Meixner, A. J. ; Nechay, B. ; Novotny, L. ; Pfeiffer, M. ; Philipona, C. ; Plakhotnik, T. ; Renn, A. ; Sayah, A. ; Segura, J. M. ; Sick, B. ; Siegner, U. ; Tarrach, G. ; Vahldieck, R. ; Wild, U. P. ; Zeisel, D. ; Zenobi, R. ; Pohl, D. W.
Published in Chimia
Volume 51
Pages 760-767
Date 1997
Keywords
DOI https://doi.org/10.2533/chimia.1997.760
Other identifier(s) View record in Web of Science
Laboratories NAM
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NAM - Nanophotonics and Metrology Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date 2011-04-11

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