Conference paper

An Integrated Probe for Electromagnetic NDT Inspection

Electromagnetic techniques present definite advantages for Non Destructive Testing such as no need for surface couplant, potential for miniaturization, and fast scanning rates. They suffer, however, from a lack of reliability when crack sizing capabilities are concerned. To improve this point, more information in the local response, in the frequency, and in the magnetic field components is required to solve the inverse electromagnetic problem. We present here an integrated probe allowing to map the local magnetic field caused by the interaction of an interrogating magnetic field and the material to be inspected. Using this probe, crack sizing capabilities can be achieved in the eddy current configuration.


    • EPFL-CONF-163278

    Record created on 2011-02-10, modified on 2016-08-09


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