Two-wavelength grating interferometry for MEMS sensors

Diffraction gratings integrated with micro-electro-mechanical-systems (MEMS) offer shot noise limited subnanometer displacement detection sensitivities but are limited in detection range for mechanical transducers. A two-wavelength readout method is developed that maintains high sensitivity while increasing the detection range, which is demonstrated using a MEMS spectrometer with integrated diffraction grating. The two-laser illumination extended the detection range from 105 nm to 1.7 mu m assuming the readout sensitivity is maintained at >50% of the maximum sensitivity.


Publié dans:
Ieee Photonics Technology Letters, 19, 1895-1897
Année
2007
Publisher:
Institute of Electrical and Electronics Engineers
ISSN:
1041-1135
Mots-clefs:
Laboratoires:




 Notice créée le 2011-01-21, modifiée le 2018-03-17


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