Design-Oriented Characterization and Parameter Extraction Methodologies for the EKV3 MOSFET Model (invited)
2007
Details
Title
Design-Oriented Characterization and Parameter Extraction Methodologies for the EKV3 MOSFET Model (invited)
Conference
NSTI-Nanotech 2007, Workshop on Compact Modeling, Boston, Massachusetts, 20-24 May 2007
Date
2007
Additional link
URL
Laboratories
IEL
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > IEL - Institute of Electrical Engineering
Presentations & Talks
Work outside EPFL
Published
Presentations & Talks
Work outside EPFL
Published
Record creation date
2011-01-06