Design-Oriented Characterization and Parameter Extraction Methodologies for the EKV3 MOSFET Model (invited)


Presented at:
NSTI-Nanotech 2007, Workshop on Compact Modeling, Boston, Massachusetts, 20-24 May 2007
Year:
2007
Laboratories:




 Record created 2011-01-06, last modified 2018-03-17

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