Scaling Issues In An 0.15μm CMOS Technology With EKV3.0
2006
Details
Title
Scaling Issues In An 0.15μm CMOS Technology With EKV3.0
Author(s)
Kitonaki, E. ; Bazigos, A. ; Bucher, M. ; Puchner, H. ; Bhardwaj, S. ; Papananos, Y.
Published in
Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.
Pages
151-158
Conference
International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006., Gdynia, Poland
Date
2006
Publisher
IEEE
Laboratories
IEL
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > IEL - Institute of Electrical Engineering
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2011-01-05