Scaling Issues In An 0.15μm CMOS Technology With EKV3.0


Published in:
Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006., 151-158
Presented at:
International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006., Gdynia, Poland
Year:
2006
Publisher:
IEEE
Laboratories:




 Record created 2011-01-05, last modified 2018-01-28


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