EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology
Yoshitomi, S.; Bazigos, A.; Bucher, M.
2007

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Title EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology
Author(s) Yoshitomi, S. ; Bazigos, A. ; Bucher, M.
Published in 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems
Pages 74-79
Conference 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, Ciechocinek, Poland, 21-23 06 2007
Date 2007
Publisher IEEE
DOI 10.1109/MIXDES.2007.4286123
Laboratories IEL
Record Appears in Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > UNATTRIBUTED-IEL - IEL - Unattributed publications
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published

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