EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology


Published in:
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, 74-79
Presented at:
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, Ciechocinek, Poland, 21-23 06 2007
Year:
2007
Publisher:
IEEE
Laboratories:




 Record created 2011-01-05, last modified 2018-09-25


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