EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology

• Presented at: 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, Ciechocinek, Poland, 21-23 06 2007
• Published in: 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, p. 74-79
• IEEE, 2007

Reference

• EPFL-CONF-162074
• doi:10.1109/MIXDES.2007.4286123

Record created on 2011-01-05, modified on 2017-05-10