Home > EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology
 

EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology

Yoshitomi, S. ; Bazigos, A. ; Bucher, M.

Published in:
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, 74-79
Presented at:
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, Ciechocinek, Poland, 21-23 06 2007
Year:
2007
Publisher:
IEEE
DOI:
10.1109/MIXDES.2007.4286123
Laboratories:
IEL

Record appears in:
Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > UNATTRIBUTED-IEL - IEL - Unattributed publications
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published



 Record created 2011-01-05, last modified 2018-09-25


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