Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes
2010
Details
Title
Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes
Author(s)
Kim, Myun Sik ; Scharf, Toralf ; Herzig, Hans Peter
Conference
Annual Conference of Association des Scientiques Coréens en France (ASCoF), Rennes, France, May 14, 2010
Date
2010
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Presentations & Talks
Work produced at EPFL
Published
Presentations & Talks
Work produced at EPFL
Published
Record creation date
2010-12-13