Measuring 3D amplitude and phase distribution of sub-wavelength diffraction phenomena
2010
Details
Title
Measuring 3D amplitude and phase distribution of sub-wavelength diffraction phenomena
Author(s)
Kim, Myun Sik
Conference
EPFL Photonics Day, Lausanne, Switzerland, November 5, 2010
Date
2010
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Presentations & Talks
Work produced at EPFL
Published
Presentations & Talks
Work produced at EPFL
Published
Record creation date
2010-12-13