Infrared scanning near-field optical microscopy investigates order and clusters in model membranes
Generosi, J.; Margaritondo, G.; Sanghera, J. S.; Aggarwal, I. D.; Tolk, N. H.; Piston, D. W.; Castellano, A. Congiu; Cricenti, A.
2008

Abstract

Due to its surface sensitivity and high spatial resolution, scanning near-field optical microscopy (SNOM) has a significant potential to study the lateral organization of membrane domains and clusters. Compared to other techniques, infrared near-field microscopy in the spectroscopic mode has the advantage to be sensitive to specific chemical bonds. In fact, spectroscopic SNOM in the infrared spectral range (IR-SNOM) reveals the chemical content of the sample with a lateral resolution around 100 nm (Cricenti et al., 1998a, 1998b, 2003).

Details

Title Infrared scanning near-field optical microscopy investigates order and clusters in model membranes
Author(s) Generosi, J. ; Margaritondo, G. ; Sanghera, J. S. ; Aggarwal, I. D. ; Tolk, N. H. ; Piston, D. W. ; Castellano, A. Congiu ; Cricenti, A.
Published in Journal Of Microscopy-Oxford
Volume 229
Pages 259-263
Conference 9th International Conference on Near-Field Optics, Nanophotonics and Related Techniques, Lausanne, SWITZERLAND, Sep 10-15, 2006
Date 2008
Keywords
DOI https://doi.org/10.1111/j.1365-2818.2008.01896.x
Other identifier(s) View record in Web of Science
Laboratories LPRX
Record Appears in Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date 2010-11-30

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