Horizontal HALL devices: A lumped-circuit model for EDA simulators

A completely scalable lumped-circuit model for horizontal HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: (a) geometrical, (b) temperature, and (c) field-dependent mobility effects, as well as for (d) the dynamic response and (e) the noise behavior of several HALL sensors. A series of experimental data is presented along with a review to junction field effect transistor (JFET) operation theory. (c) 2007 Elsevier B.V. All rights reserved.


Published in:
Sensors And Actuators A-Physical, 145, 161-175
Presented at:
14th International Conference on Solid-State Sensors, Actuators and Microsystems, Lyon, FRANCE, Jun 10-14, 2007
Year:
2008
Keywords:
Laboratories:




 Record created 2010-11-30, last modified 2018-01-28


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