Horizontal HALL devices: A lumped-circuit model for EDA simulators
A completely scalable lumped-circuit model for horizontal HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: (a) geometrical, (b) temperature, and (c) field-dependent mobility effects, as well as for (d) the dynamic response and (e) the noise behavior of several HALL sensors. A series of experimental data is presented along with a review to junction field effect transistor (JFET) operation theory. (c) 2007 Elsevier B.V. All rights reserved.
Keywords: magnetometer ; HALL effect ; Spice ; lumped model ; EDA simulator ; Field-Effect Transistors ; Velocity Saturation ; Numerical-Analysis ; Cmos Technology ; Noise Behavior ; Spice ; Sensors ; Frequencies ; Fets
Record created on 2010-11-30, modified on 2016-08-09