Polarized neutron reflectometry of the influence of Fe/Si, Fe/FeSi2 and Au/Fe interfaces on the magnetic properties of epitaxial Fe films
The magnetic and structural properties of epitaxial Fe films grown on Si(111) are investigated by polarized neutron re. ectometry (PNR) at room temperature. The influence of different types of interfaces, Fe/Si, Fe/FeSi2 and Au/Fe on the magnetic properties of Fe films deposited by molecular beam epitaxy onto Si(111) are characterized. We observe a drastic reduction of the magnetic moment in the entire Fe film deposited directly on the silicon substrate essentially due to strong Si interdiffusion throughout the whole Fe layer thickness. The use of a silicide FeSi2 template layer stops the interdiffusion and the value of the magnetic moment of the deposited Fe layer is close to its bulk value. We also evidence the asymmetric nature of the interfaces, Si/Fe and Fe/Si interfaces are magnetically very different. Finally, we show that the use of Au leads to an enhancement of the magnetization at the interface. (C) 2008 Elsevier B.V. All rights reserved.
Keywords: Polarized neutron reflectometry ; X-ray reflectometry ; Epitaxy ; Metal-semiconductor interface ; Magnetic structure ; Uniaxial Anisotropy ; Thin-Films ; Si(111) ; Growth ; Layers ; Reflection ; Si(001) ; Origin
Record created on 2010-11-30, modified on 2016-08-09