Strong coupling in high-finesse organic semiconductor microcavities
We report the fabrication of high-finesse strongly coupled microcavities composed of a polystyrene film doped with the dye tetraphenyl-porphyrin zinc positioned between two high reflectivity dielectric mirrors. The bottom mirror was deposited by plasma enhanced chemical vapor deposition, and was composed of 11 lambda/4 thick (silicon oxide/silicon nitride) pairs. The organic layer was deposited on to this by spin coating. Finally, the top mirror was deposited by thermal evaporation and consisted of 12 lambda/4 thick (tellurium oxide/lithium fluoride) pairs. Such cavities are characterized by Q factors of between 440 and 620. Strong coupling was evidenced via white light reflectivity measurements. Due to the high cavity Q factor, a Rabi splitting of 135 meV at resonance was very clearly resolved. (C) 2003 American Institute of Physics.