Compact Modeling of Lateral Nonuniform Doping in High-Voltage MOSFETs
2007
Details
Title
Compact Modeling of Lateral Nonuniform Doping in High-Voltage MOSFETs
Author(s)
Chauhan, Yogesh Singh ; Krummenacher, Franois ; Gillon, Renaud ; Bakeroot, Benoit ; Declercq, Michel J. ; Ionescu, Adrian Mihai
Published in
IEEE Transactions on Electron Devices
Volume
54
Issue
6
Pages
1527-1539
Date
2007
Publisher
Institute of Electrical and Electronics Engineers
ISSN
0018-9383
Other identifier(s)
View record in Web of Science
DAR: 10796
DAR: 10796
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Work produced at EPFL
Journal Articles
Published
Work produced at EPFL
Journal Articles
Published
Record creation date
2010-11-08