Fault-tolerant multi-level logic decoder for nanoscale crossbar memory arrays


Published in:
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 765-772
Presented at:
IEEE/ACM International Conference on Computer-Aided Design, San Jose, California, USA, November 4-8
Year:
2007
Publisher:
IEEE
Laboratories:




 Record created 2010-11-08, last modified 2018-03-18


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