Conference paper

On recent developments for high-speed atomic force microscopy

The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.


    Times Cited: 0

    IEEE/ASME International Conference on Advanced Intelligent Mechatronics

    JUL 24-28, 2005

    Monterey, CA


    Record created on 2010-11-05, modified on 2017-05-10


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