On recent developments for high-speed atomic force microscopy

The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.


Published in:
2005 Ieee/Asme International Conference on Advanced Intelligent Mechatronics, Vols 1 and 2, 261-264
Year:
2005
Note:
Times Cited: 0
IEEE/ASME International Conference on Advanced Intelligent Mechatronics
JUL 24-28, 2005
Monterey, CA
Laboratories:




 Record created 2010-11-05, last modified 2018-03-16


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