Infoscience

Patent

Scanning probe microscope e.g. atomic force microscope, has two actuators arranged in opposed push-pull configuration, and support constrains motion of one of two actuators in one axis to permit translation along another axis

NOVELTY - The microscope has a housing (12), and two actuators (14, 16) are arranged in an opposed push-pull configuration that is coupled to the housing. A support (22) is coupled to the housing and to one of the two actuators at a position that is spaced from a point at which the actuator is coupled to the housing. The support constrains a motion of one of the two actuators along an axis to permit translation along another axis. USE - Scanning probe microscope e.g. atomic force microscope. ADVANTAGE - The support constrains the motion of one of the two actuators in one axis to permit translation along another axis, thus reducing mechanical oscillations while imaging, and hence improving the efficiency of the scanning probe microscope.

    Note:

    Times Cited: 0

    Reference

    • EPFL-PATENT-154191

    Record created on 2010-11-05, modified on 2016-08-08

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