In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.
Titre
Off-Axis Low Coherence Interferometry for Surface Topology Measurement
Publié dans
Speckle 2010: Optical Metrology
Série
Proceedings of SPIE-The International Society for Optical Engineering, 7387
Pages
738715
Présenté à
Speckle 2010, Florianopolis, Brazil, September, 13-15, 2010
Date
2010
Editeur
Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa
ISBN
978-0-8194-7670-8
Date de création de la notice
2010-11-01