Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives

Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode,using the Vanderbilt University free electron laser,started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties.The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.


Published in:
Infrared Physics & Technology, 45, 5-6, 409-416
Year:
2004
Publisher:
Elsevier
ISSN:
1350-4495
Keywords:
Note:
Ecole Polytech Fed Lausanne, Fac Sci Base, CH-1015 Lausanne, Switzerland. USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA. Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA. Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy. Vanderbilt Univ, Dept Mol Physiol & Biophys, Nashville, TN 37232 USA. Univ Rome Tre, Dipartimento Fis, I-00146 Rome, Italy. ENEA, UTSTecnol Fis Avanzate, CR Frascati, I-00044 Frascati, Italy. Ist Stuttura Mat, I-00133 Rome, Italy. Vobornik, D, Ecole Polytech Fed Lausanne, Fac Sci Base, CH-1015 Lausanne, Switzerland. dusan.vobornik@epfl.ch
ISI Document Delivery No.: 848WT
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