Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives
Vobornik, D.; Margaritondo, G.; Sanghera, J. S.; Thielen, P.; Aggarwal, I. D.; Ivanov, B.; Miller, J. K.; Haglund, R.; Tolk, N. H.; Congiu-Castellano, A.; Rizzo, M. A.; Piston, D. W.; Somma, F.; Baldacchini, G.; Bonfigli, F.; Marolo, T.; Flora, F.; Montereali, R. M.; Faenov, A.; Pikuz, T.; Longo, G.; Mussi, V.; Generosi, J.; Luce, M.; Perfetti, P.; Cricenti, A.
2004

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Abstract

Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode,using the Vanderbilt University free electron laser,started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties.The practical examples presented here show the great potential of this new technique both in materials science and in life sciences.

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Title Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives
Author(s) Vobornik, D. ; Margaritondo, G. ; Sanghera, J. S. ; Thielen, P. ; Aggarwal, I. D. ; Ivanov, B. ; Miller, J. K. ; Haglund, R. ; Tolk, N. H. ; Congiu-Castellano, A. ; Rizzo, M. A. ; Piston, D. W. ; Somma, F. ; Baldacchini, G. ; Bonfigli, F. ; Marolo, T. ; Flora, F. ; Montereali, R. M. ; Faenov, A. ; Pikuz, T. ; Longo, G. ; Mussi, V. ; Generosi, J. ; Luce, M. ; Perfetti, P. ; Cricenti, A.
Published in Infrared Physics & Technology
Volume 45
Issue 5-6
Pages 409-416
Date 2004
Publisher Elsevier
ISSN 1350-4495
Keywords
Note Ecole Polytech Fed Lausanne, Fac Sci Base, CH-1015 Lausanne, Switzerland. USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA. Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA. Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy. Vanderbilt Univ, Dept Mol Physiol & Biophys, Nashville, TN 37232 USA. Univ Rome Tre, Dipartimento Fis, I-00146 Rome, Italy. ENEA, UTSTecnol Fis Avanzate, CR Frascati, I-00044 Frascati, Italy. Ist Stuttura Mat, I-00133 Rome, Italy. Vobornik, D, Ecole Polytech Fed Lausanne, Fac Sci Base, CH-1015 Lausanne, Switzerland. dusan.vobornik@epfl.ch
ISI Document Delivery No.: 848WT
DOI https://doi.org/10.1016/j.infrared.2004.01.007
Other identifier(s) View record in Web of Science
Laboratories LSE
LPMV
LPRX
Record Appears in Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPMV - Laboratory of the Physics of Living Matter
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LSE - Laboratory of Photoelectron Spectroscopy
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date 2010-08-20

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