Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)

Scanning near-field optical microscopy (SNOM or NSOM) is the technique with the highest lateral optical resolution available today, while infrared (IR) spectroscopy has a high chemical specificity. Combining SNOM with a tunable IR source produces a unique tool, IR-SNOM, capable of imaging distributions of chemical species with a 100 nm spatial resolution. We present in this paper boron nitride (BN) thin film images, where IR-SNOM shows the distribution of hexagonal and cubic phases within the sample. Exciting potential applications in biophysics and medical sciences are illustrated with SNOM images of the distribution of different chemical species within cells. We present in this article images with resolutions of the order of λ/60 with SNOM working with infrared light. With our SNOM setup, we routinely get optical resolutions between 50 and 150 nm, regardless of the wavelength of the light used to illuminate the sample.


Published in:
Journal of Alloys and Compounds, 401, 1-2, 80-85
Year:
2005
Publisher:
Elsevier
ISSN:
0925-8388
Keywords:
Note:
Ecole Polytech Fed Lausanne, Inst Phys Mat Complexe, CH-1015 Lausanne, Switzerland. USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA. Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA. Inst Neurobiol & Mol Med, I-00133 Rome, Italy. Vanderbilt Univ, Dept Mol Physiol & Biophys, Nashville, TN 37232 USA. Ist Struttura Mat, I-00133 Rome, Italy. Vobornik, D, Ecole Polytech Fed Lausanne, Inst Phys Mat Complexe, Stn 3, CH-1015 Lausanne, Switzerland. dusan.vobornik@epfl.ch
ISI Document Delivery No.: 969WY
Laboratories:




 Record created 2010-08-20, last modified 2018-09-13

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