000149701 001__ 149701
000149701 005__ 20190316234821.0
000149701 037__ $$aCONF
000149701 245__ $$aCarbon Nanotube Correlation: Promising Opportunity for CNFET Circuit Yield Enhancement
000149701 269__ $$a2010
000149701 260__ $$c2010
000149701 336__ $$aConference Papers
000149701 520__ $$aCarbon Nanotubes (CNTs) are grown using chemical synthesis, and the exact positioning and chirality of CNTs are very difficult to control. As a result, “small-width” Carbon Nanotube Field-Effect Transistors (CNFETs) can have a high probability of containing no semiconducting CNTs, resulting in CNFET failures. Upsizing these vulnerable smallwidth CNFETs is an expensive design choice since it can result in substantial area/power penalties. This paper introduces a processing/design co-optimization approach to reduce probability of CNFET failures at the chip-level. Large degree of spatial correlation observed in directional CNT growth presents a unique opportunity for such optimization. Maximum benefits from such correlation can be realized by enforcing the active regions of CNFETs to be aligned with each other. This approach relaxes the device-level failure probability requirement by 350X at the 45nm technology node, leading to significantly reduced costs associated with upsizing the small-width CNFETs
000149701 6531_ $$aCarbon Nanotube
000149701 6531_ $$aCNT
000149701 6531_ $$aYield Optimization
000149701 6531_ $$aCNT Correlation
000149701 700__ $$aZhang, Jie
000149701 700__ $$aBobba, Shashikanth
000149701 700__ $$aPatil, Nishant
000149701 700__ $$aLin, Albert
000149701 700__ $$aWong, H.-S. Philip
000149701 700__ $$0240269$$g167918$$aDe Micheli, Giovanni
000149701 700__ $$aMitra, Subhasish
000149701 7112_ $$dJune 13-18, 2010$$cAnaheim, California, USA$$a47th Design Automation Conference (DAC 2010)
000149701 773__ $$j1$$tProceedings of the 47th Design Automation Conference (DAC 2010)$$q889-892
000149701 8564_ $$uhttps://infoscience.epfl.ch/record/149701/files/De_Micheli_DAC_2010_51.3.pdf$$zn/a$$s314261$$yn/a
000149701 909C0 $$xU11140$$0252283$$pLSI1
000149701 909CO $$pIC$$ooai:infoscience.tind.io:149701$$qGLOBAL_SET$$pconf$$pSTI
000149701 917Z8 $$x176271
000149701 917Z8 $$x112915
000149701 937__ $$aEPFL-CONF-149701
000149701 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000149701 980__ $$aCONF