An Analytical Thermal Noise Model of DG MOSFET and Comparison with Bulk MOSFET
2007
Details
Title
An Analytical Thermal Noise Model of DG MOSFET and Comparison with Bulk MOSFET
Author(s)
Roy, A. S. ; Enz, C. C.
Published in
Proc. of the Int. Conf. on Noise and Fluctuations (ICNF)
Pages
51-54
Date
2007
Laboratories
LSI2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSI2 - Integrated Systems Laboratory (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-06-24