Details
Title
Validity of the Flat Band Perturbation Technique in Non-ohmic Region
Author(s)
Roy, A. S. ; Enz, C. C.
Published in
2006 European Solid-State Device Research Conference
Pages
443-446
Date
2006
Laboratories
LSI2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSI2 - Integrated Systems Laboratory (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-06-24