Details
Title
On The Compact Modelling of Induced Gate Noise in the MOS Transistor
Author(s)
Roy, A. S. ; Enz, C. C.
Published in
NSTI Nanotech - Workshop on Compact Modeling (WCM 2006)
Volume
3
Issue
3
Pages
757-760
Date
2006
Laboratories
LSI2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSI2 - Integrated Systems Laboratory (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-06-24