Infoscience

Conference paper

On The Compact Modelling of Induced Gate Noise in the MOS Transistor

Roy, A. S.; Enz, C. C.
  • Published in: NSTI Nanotech - Workshop on Compact Modeling (WCM 2006), vol. 3, num. 3, p. 757-760
  • Publication date: 2006

    Reference

    • EPFL-CONF-149654

    Record created on 2010-06-24, modified on 2017-05-12

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