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On The Compact Modelling of Induced Gate Noise in the MOS Transistor

Roy, A. S. ; Enz, C. C.

Published in:
NSTI Nanotech - Workshop on Compact Modeling (WCM 2006), 3, 3, 757-760
Year:
2006
Laboratories:
LSI2

Record appears in:
Scientific production and competences > Archives > I&C - School of Computer and Communication Sciences > LSI2 - Integrated Systems Laboratory 2 (STI/IC)
Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > LSI2 - Integrated Systems Laboratory 2 (STI/IC)
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published



 Record created 2010-06-24, last modified 2018-03-17


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