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The EKV MOST Model and the Associated Parameter Extraction

Lallement, C. ; Bucher, M. ; Enz, C.

Published in:
Proc. of the European HP IC-CAP Users Meeting
Year:
1995
Laboratories:
LSI2

Record appears in:
Scientific production and competences > Archives > I&C - School of Computer and Communication Sciences > LSI2 - Integrated Systems Laboratory 2 (STI/IC)
Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > LSI2 - Integrated Systems Laboratory 2 (STI/IC)
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published



 Record created 2010-06-24, last modified 2018-03-17


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