Details
Title
A Comprehensive Study of Thermal Noise in the MOS Transistor
Author(s)
Enz, Christian C. ; Roy, Ananda S.
Published in
Symposium on Fluctuations and Noise - Noise in Devices and Circuits II
Series
SPIE Proceedings, 5470
Pages
84-95
Date
2004
Publisher
SPIE
Keywords
Laboratories
LSI2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSI2 - Integrated Systems Laboratory (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-06-24