An Efficient Parameter Extraction Methodology for the EKV MOST Model
1996
Details
Title
An Efficient Parameter Extraction Methodology for the EKV MOST Model
Author(s)
Bucher, M. ; Lallement, C. ; Enz, C. C.
Published in
Proceedings of International Conference on Microelectronic Test Structures
Pages
145-150
Date
1996
Laboratories
LSI2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSI2 - Integrated Systems Laboratory (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-06-24