The EKV 3.0 Compact MOS Transistor Model: Accounting for Deep-Submicron Aspects

• Published in: Workshop on Compact Modeling at the International Conference on Modeling and Simulation of Microsystems, p. 670-673
• Publication date: 2002

Keywords: EKV ; Device Modeling ; MOST Modeling ; RF ; NQS

Note:

(invited)

Reference

• EPFL-CONF-149508

Record created on 2010-06-24, modified on 2017-06-01