Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision

We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.


Published in:
Novel Techniques in Microscopy
Presented at:
Novel Techniques in Microscopy (NTM), Vancouver, CA, April 30, 2009
Year:
2009
Keywords:
Laboratories:




 Record created 2010-05-27, last modified 2018-03-17


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