Advanced Scanning Probes for Micro-Nano Science Researches

In this study, we introduce five unique scanning vibes developed in our laboratory for different fields of application These probes are the results of excellent collaborations with many external partners Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system The applications of these probes are very versatile. from atomic force microscope for the exploration of Mars to In vivo measurements of human knee cartilage (C) 2010 Institute of Electrical Engineers of Japan Published by John Wiley & Sons. Inc


Published in:
IEEJ Transactions On Electrical And Electronic Engineering, 5, 259-262
Year:
2010
Publisher:
Wiley-Blackwell
ISSN:
1931-4973
Keywords:
Laboratories:




 Record created 2010-05-19, last modified 2018-03-17


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