Surface characterization of metallic molecular organic thin films: tetrathiafulvalene tetracyanoquinodimethane
The electronic structure of ex situ grown highly oriented thin films of the quasi-ID organic metal tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) has been characterized by means of temperature-dependent high-resolution angle-resolved photoemission spectroscopy and X-ray photoelectron spectroscopy. Band dispersion near the Fermi level (EF) is observed at low temperatures (similar to 100 K) for as-received samples. At room temperature both charged and neutral TCNQ species (TCNQ(-) and TCNQ(0), respectively) coexist at the surface. The presence of TCNQ(0), partly due to surface thermal vibrations. is reduced at lower temperatures because of the smaller surface oscillation amplitudes. (C) 2001 Elsevier Science B.V. All rights reserved.
Keywords: angle resolved photoemission ; X-ray photoelectron spectroscopy ; polycrystalline thin films ; metallic films ; Angle-Resolved Photoemission ; One-Dimensional Conductors ; Luttinger-Liquid Behavior ; Ttf-Tcnq ; Charge-Transfer ; Spectroscopy
Record created on 2010-04-07, modified on 2016-08-08