Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold: Evidence of spin flip

We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.


Published in:
Physical Review Letters, 95, 197402
Year:
2005
Publisher:
American Physical Society
ISSN:
0031-9007
Keywords:
Laboratories:




 Record created 2010-04-07, last modified 2018-03-17


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