Near-edge x-ray absorption fine-structure investigation of graphene

We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.


Published in:
Physical Review Letters, 101, 066806
Year:
2008
Publisher:
American Physical Society
ISSN:
0031-9007
Keywords:
Laboratories:




 Record created 2010-04-01, last modified 2018-09-13


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