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Abstract

Comprehensive analysis of noise sources in photocharge detectors leads to two novel, compact pixel circuits for ultra-low-noise light detection using optimum bandwidth engineering. A synchronous 4T CMOS image sensor pixel with in-pixel amplification reaches 0.9e- readout noise, 1.5e- overall noise and 300μV/e- pixel conversion factor. An asynchronous 6T pixel for time-resolved pulse detection shows an amplitude noise of 12e-.

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