Electrical Conductance of molecular junctions by a robust statistical analysis
2006
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Title
Electrical Conductance of molecular junctions by a robust statistical analysis
Author(s)
González, M. T. ; Wu, S. ; Huber, R. ; van der Molen, S. J. ; Schönenberger, C. ; Calame, M.
Published in
Nano letters
Volume
6
Pages
2238-2242
Date
2006
Publisher
American Chemical Society
ISSN
1530-6984
Laboratories
IMT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > IMT - Institute of Microengineering
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2010-03-07