Enhancing Accuracy and Sensitivity of Temperature Gradient Measurements in DOE Schardin Schlieren #2 Using Windowed Fourier Transform Method


Published in:
Int. Conf. on Advanced Phase Measurement Methods in Optics and Imaging, 1236, 124-128
Presented at:
Advanced Phase Measurement Methods in Optics and Imaging, Locarno, Switzerland, May 17-21, 2010
Year:
2010
Publisher:
AIP
Laboratories:




 Record created 2010-02-19, last modified 2018-09-13

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