TEM characterization of textured silicon heterojunction solar cells
Hessler-Wyser, A.; Monachon, C.; Ollibet, S.; Ballif, C.
2008

Abstract

The usefulness of Transmission Electron Microscopy (TEM) for the fabrication of high-performance textured amorphous/crystalline silicon (a-Si:H/c-Si) heterojunction (HJ) solar cells is demonstrated. The classical characterization techniques used to monitor the a-Si:H layers properties incorporated into flat HJ solar cells with high open-circuit voltages up to VOC=710 mV and electrical conversion efficiencies up to

Details

Title TEM characterization of textured silicon heterojunction solar cells
Author(s) Hessler-Wyser, A. ; Monachon, C. ; Ollibet, S. ; Ballif, C.
Conference EMC2008, Aachen, September 1-5, 2008
Date 2008
Keywords
Laboratories CIME
Record Appears in Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Work produced at EPFL
Published
Posters
Record creation date 2010-02-15