Fast Quality Control with Diffractive Micro-and Nanostructures
2009
Details
Title
Fast Quality Control with Diffractive Micro-and Nanostructures
Author(s)
Homsy, A. ; Rytka, C. ; Gobrecht, J. ; Pierer, J. ; Bosshard, C. ; de Rooij, N.F.
Conference
CTI Micro and Nano Technologies Event 2009, Neuchâtel, November 11, 2009
Date
2009
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Presentations & Talks
Work produced at EPFL
Published
Presentations & Talks
Work produced at EPFL
Published
Record creation date
2010-02-11