Characterization of small size microlenses by high resolution interference immersion microscopy
2009
Details
Title
Characterization of small size microlenses by high resolution interference immersion microscopy
Author(s)
Scharf, Toralf ; Kim, M.-S. ; Herzig, Hans Peter
Conference
15th Microoptics Conference (MOC 09), Tokyo, October 25-28 2009
Date
2009
Additional link
Conference website
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Presentations & Talks
Work produced at EPFL
Published
Presentations & Talks
Work produced at EPFL
Published
Record creation date
2010-01-22