Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer
Hecht, M.H.; Marshall, J.; Pike, W.T.; Staufer, U.; Blaney, D.; Braendlin, D.; Gautsch, S.; Goetz, W.; Hidber, H.R.; Keller, H.U.; Markiewicz, W.J.; Mazer, A.; Meloy, T.P.; Morookian, J.M.; Mogensen, C.; Parrat, D.; Smith, P.; Sykulska, H.; Tanner, R.J.; Reynolds, R.O.; Tonin, A.; Vijendran, S.; Weilert, M.; Woida, P.M.
2008

Abstract

The Phoenix microscopy station, designed for the study of Martian dust and soil,consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light-emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet-induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.

Details

Title Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer
Author(s) Hecht, M.H. ; Marshall, J. ; Pike, W.T. ; Staufer, U. ; Blaney, D. ; Braendlin, D. ; Gautsch, S. ; Goetz, W. ; Hidber, H.R. ; Keller, H.U. ; Markiewicz, W.J. ; Mazer, A. ; Meloy, T.P. ; Morookian, J.M. ; Mogensen, C. ; Parrat, D. ; Smith, P. ; Sykulska, H. ; Tanner, R.J. ; Reynolds, R.O. ; Tonin, A. ; Vijendran, S. ; Weilert, M. ; Woida, P.M.
Published in Journal of Geophysical Research
Volume 113
Issue E00A22
Pages 1-28
Date 2008
DOI https://doi.org/10.1029/2008JE003077
Laboratories SAMLAB
Record Appears in Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date 2010-01-22

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