Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
2009
Details
Title
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Author(s)
Stanisavljevic, M. ; Schmid, A. ; Leblebici, Y.
Published in
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Conference
4th International Conference on Nano-Nets (Nano-Net), Lucerne, Switzerland, October 18-20, 2009
Date
2009
Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2009-11-19