Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth


Published in:
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Presented at:
4th International Conference on Nano-Nets (Nano-Net), Lucerne, Switzerland, October 18-20, 2009
Year:
2009
Laboratories:




 Record created 2009-11-19, last modified 2018-03-17


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