Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Stanisavljevic, M.; Schmid, A.; Leblebici, Y.
2009

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Title Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Author(s) Stanisavljevic, M. ; Schmid, A. ; Leblebici, Y.
Published in Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Conference 4th International Conference on Nano-Nets (Nano-Net), Lucerne, Switzerland, October 18-20, 2009
Date 2009
Laboratories LSM
Record Appears in Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published

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