Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
2009
Details
Title
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
Author(s)
Stanisavljevic, M. ; Schmid, A. ; Leblebici, Y.
Published in
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Conference
4th International Conference on Nano-Nets (Nano-Net), Lucerne, Switzerland, October 18-20, 2009
Date
2009
Laboratories
LSM