Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks
2009
Details
Title
Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks
Author(s)
Nikolaou, N ; Dimitrakis, P ; Normand, P ; Schamm, Sylvie ; Bonafos, Caroline ; Ben Assayag, Gerard ; Mouti, Anas ; Ioannou-Sougleridis, V
Published in
Nanotechnology
Volume
20
Issue
30
Pages
305704
Date
2009
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2009-11-09