Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks
Nikolaou, N; Dimitrakis, P; Normand, P; Schamm, Sylvie; Bonafos, Caroline; Ben Assayag, Gerard; Mouti, Anas; Ioannou-Sougleridis, V
2009

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Title Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks
Author(s) Nikolaou, N ; Dimitrakis, P ; Normand, P ; Schamm, Sylvie ; Bonafos, Caroline ; Ben Assayag, Gerard ; Mouti, Anas ; Ioannou-Sougleridis, V
Published in Nanotechnology
Volume 20
Issue 30
Pages 305704
Date 2009
DOI 10.1088/0957-4484/20/30/305704
Laboratories CIME
Record Appears in Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
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