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Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks

Nikolaou, N ; Dimitrakis, P ; Normand, P ; Schamm, Sylvie[...]

Published in:
Nantechnology, 20, 30
Year:
2009
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2009-11-09, last modified 2018-03-17


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