Super-resolved position and orientation of fluorescent dipoles

We introduce an efficient, image formation model-based algorithm that extends super-resolution fluorescence localization to include orientation estimation, and report experimental accuracies of 5 nanometers for position estimation and 2 degrees for dipole orientation estimation.


Published in:
Proceedings of SPIE, 7367, 73670Y
Presented at:
ECBO 2009, Advanced Microscopy Techniques, Munich, Germany, June 14-18 2009
Year:
2009
Publisher:
SPIE
Laboratories:




 Record created 2009-10-27, last modified 2018-01-28


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