Engineering of Extended Focii for Optical Coherence Microscopy

Based on a Debye integral approach, we engineered an extended focal field distribution for Fourier domain optical coherence microscopy. This simulation optimizes beam con- figurations for high lateral resolution combined with extended depth of field.


Presented at:
ECBO 2009, Optical Coherence Tomography and Coherence Techniques Posters, Munich, Germany, June 14-18 2009
Year:
2009
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2009-10-27, last modified 2018-03-17

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