Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction"
2005
Details
Title
Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction"
Author(s)
Bongiorno, A. ; Pasquarello, A.
Published in
Physical Review Letters
Volume
94
Issue
18
Pages
189601
Date
2005
Other identifier(s)
View record in Web of Science
Laboratories
CSEA
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > CSEA - Chair of Atomic Scale Simulation
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2009-10-08