Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy
2009
Details
Title
Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy
Author(s)
Depeursinge, Christian ; Bergoënd, Isabelle ; Pavillon, Nicolas ; Kühn, Jonas ; Colomb, Tristan ; Montfort, Frédéric ; Cuche, Etienne ; Emery, Yves
Published in
Proceedings of the 6th International Workshop on Advanced Optical Metrology
Pages
411-415
Conference
Fringe 2009, The 6th International Workshop on Advanced Optical Metrology, Nürtingen, September 14-16, 2009
Date
2009
Publisher
Springer
Keywords
Laboratories
LOA
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2009-09-17